The AFM equipment available in E&T building room C164A is as follows:
Bruker dimension Icon with Scanasyst
The Icon tip-scanning AFM technology incorporates temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis and angstroms in XY. The 90-micron scan range system surpasses the open-loop noise levels. The XYZ closed-loop head also delivers a higher scan speed, without loss of image quality, to enable greater throughput for data collection.
-
Quantitative Nano-Mechanical Mapping
-
Electrical Characterization
-
Nanoindentation and Nanomanipulation: Indentations 1 to 100μm
-
Imaging Modes:
Contact mode AFM
Tapping mode AFM
PeakForce Tapping
ScanAsyst: automatic image optimization
PhaseImaging
LiftMode
Torsional Resonance Mode (TRmode)
Magnetic Force Microscopy (MFM)
Electrostatic Force Microscopy (EFM)
Lateral Force Microscopy (LFM)
Piezo Response (PFM)
Scanning Tunneling Microscopy (STM)
AFM in Fluid
Force curve
Nano-Indentation
Nanomanipulation (Nanolithography)
PeakForce QNM: new sample information with nanoscale quantitative nanomechanical mapping (Young’s modulus, surface adhesion, energy dissipation, etc.)
PeakForce KPFM: New quantitative, highest resolution workfunction measurements.
PeakForce TUNA: highest resolution current mapping on fragile samples in conjunction with mechanical information
Sample Heating and Cooling: temperature-gradient (-30°C to 250°C) studies with the greatest precision